5  * Test random reads, writes and erases on MTD device.
16 #include <linux/mtd/mtd.h>
26 MODULE_PARM_DESC(dev, "MTD device number to use");
32 static struct mtd_info *mtd;  variable
73 		if (offs >= mtd->erasesize)  in do_read()
74 			offs -= mtd->erasesize;  in do_read()
75 		if (offs + len > mtd->erasesize)  in do_read()
76 			len = mtd->erasesize - offs;  in do_read()
78 	addr = (loff_t)eb * mtd->erasesize + offs;  in do_read()
79 	return mtdtest_read(mtd, addr, len, readbuf);  in do_read()
88 	if (offs >= mtd->erasesize) {  in do_write()
89 		err = mtdtest_erase_eraseblock(mtd, eb);  in do_write()
96 	if (offs + len > mtd->erasesize) {  in do_write()
98 			len = mtd->erasesize - offs;  in do_write()
100 			err = mtdtest_erase_eraseblock(mtd, eb + 1);  in do_write()
106 	addr = (loff_t)eb * mtd->erasesize + offs;  in do_write()
107 	err = mtdtest_write(mtd, addr, len, writebuf);  in do_write()
111 	while (offs > mtd->erasesize) {  in do_write()
112 		offsets[eb++] = mtd->erasesize;  in do_write()
113 		offs -= mtd->erasesize;  in do_write()
137 		pr_info("Please specify a valid mtd-device via module parameter\n");  in mtd_stresstest_init()
138 		pr_crit("CAREFUL: This test wipes all data on the specified MTD device!\n");  in mtd_stresstest_init()
142 	pr_info("MTD device: %d\n", dev);  in mtd_stresstest_init()
144 	mtd = get_mtd_device(NULL, dev);  in mtd_stresstest_init()
145 	if (IS_ERR(mtd)) {  in mtd_stresstest_init()
146 		err = PTR_ERR(mtd);  in mtd_stresstest_init()
147 		pr_err("error: cannot get MTD device\n");  in mtd_stresstest_init()
151 	if (mtd->writesize == 1) {  in mtd_stresstest_init()
156 		pgsize = mtd->writesize;  in mtd_stresstest_init()
158 	tmp = mtd->size;  in mtd_stresstest_init()
159 	do_div(tmp, mtd->erasesize);  in mtd_stresstest_init()
161 	pgcnt = mtd->erasesize / pgsize;  in mtd_stresstest_init()
163 	pr_info("MTD device size %llu, eraseblock size %u, "  in mtd_stresstest_init()
166 	       (unsigned long long)mtd->size, mtd->erasesize,  in mtd_stresstest_init()
167 	       pgsize, ebcnt, pgcnt, mtd->oobsize);  in mtd_stresstest_init()
176 	bufsize = mtd->erasesize * 2;  in mtd_stresstest_init()
185 		offsets[i] = mtd->erasesize;  in mtd_stresstest_init()
191 	err = mtdtest_scan_for_bad_eraseblocks(mtd, bbt, 0, ebcnt);  in mtd_stresstest_init()
216 	put_mtd_device(mtd);  in mtd_stresstest_init()